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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1248

Title: Magnetoresistance and spin fluctuation resistivity of α-Mn thin films and their relationship to substrate temperatures
Authors: Boakye, F.
Nkum, R. K.
Adanu, K. G.
Issue Date: 8-Sep-2000
Abstract: Electrical resistivity measurements in thermally evaporated a-Mn thin films have been carried out between 10 and 1.4 K using the van der Pauw four probe technique in magnetic fields up to 9 T. The results reveal a wide variation of the anomalous coefficient of T2 at low temperatures. This variation is found to be influenced by substrate temperatures. At high substrate temperatures (~300°C) a film whose residual resistivity in the expected range (0.10-0.85 µΩm) of bulk α-Mn is formed and its anomalously large coefficient of 7` at low temperatures is found to decrease appreciably with magnetic field. The magnitude of the resistivity at such low temperatures does not change for films coated on substrates held below 200°C in fields up to 9 T. In such films the coefficient of T2 is negative and the magnitude of the coefficient of T2, (A) increases with decreasing substrate temperatures.. Keywords: Manganese; Magnetic moment; Spin fluctuations; Resistivity
Description: This article was published in 2000 by Elsevier Science Ltd.
URI: http://hdl.handle.net/123456789/1248
Appears in Collections:College of Science

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