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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1250

Title: Critical scattering of conduction electrons around the Niel temperature of a-manganese thin films
Authors: Boakye, F.
Adanu, K. G.
Grassie, A. D. C.
Issue Date: 8-Sep-1994
Abstract: The critical scattering of conduction electrons in the neighbourhood of the Ned temperature of Mn thin films has been studied using our resistivity-temperature curves. The Mel temperature of a-Mn thin films has been established as 90± I K and an analysis of the resistivity results near the Mel temperature gave critical exponents which are in moderate agreement with existing theories.
Description: This article was published in 1994 by Elsevier Science Ltd.
URI: http://hdl.handle.net/123456789/1250
Appears in Collections:College of Science

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