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|Title: ||The anomalous low temperature resistivity and critical scattering of conduction electrons around the neel point of a-Mn films containing dilute concentration of Ni|
|Authors: ||Boakye, F.|
Adanu, K. G.
Nkum, R. K.
|Issue Date: ||2001|
|Publisher: ||Elsevier Science Ltd|
|Abstract: ||Electrical resistivity measurements on thermally evaporated Mn100-xNix films (with x = 0.01. 0.02 and 0.05 at.% Ni) have been performed over the temperature range from 300 to 1.4 K using the van der
Pauw four probe technique. The Neel point (TN) of the films determined using the model of Graig and Goldburg reveals a shift to upper values as the concentration of Ni is increased. Analysis of the resistivity data near the Neel points of these alloys gave critical exponents which are in moderate agreement with existing theories. The low temperature resistivity of the 0.02 and 0.05 at. % Ni in Mn specimens obeys a T2 law indicating a spin fluctuation scattering mechanism in these alloys.
Keywords: Resistivity; Critical exponent analysis; Anti ferromagnetic transition|
|Description: ||This article was published by Elsevier Science Ltd in 2001.|
|Appears in Collections:||College of Science|
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