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http://hdl.handle.net/123456789/5094
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Title: | Automatic Test Pattern Generation for Iterative Logic Arrays |
Authors: | Boateng, K.O. |
Keywords: | Test pattern generation C-test. Design for testability (DFT) |
Issue Date: | 2004 |
Publisher: | Journal of Science and Technology |
Citation: | Journal of Science and Technology, Vol. 24 No. 2, 2004 pp 1-7 |
Abstract: | In this work, measures to evaluate fault-effect propagation of test patterns of a C-test are first formulated. Next, the repetition property of the test patterns is exploited to develop a method for generating C-tests for ILAs under the cell fault model. Based on the results of test generation, the method identifies points of insertion of extra hardware in order to achieve C-testability for the target array. Finally, results obtained by applying the proposed method to generate minimum C-tests for a few well-known arithmetic arrays are shown. |
Description: | Article published in the Journal of Science and Technology, Vol. 24 No. 2, 2004 pp 1-7 |
URI: | http://hdl.handle.net/123456789/5094 |
Appears in Collections: | Journal of Science and Technology 2000-
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