Structural and optoelectronic properties of copper, zinc, cadmium and lead chalcogenide nanocrystalline thin films deposited at the water-toluene interface

dc.contributor.authorAsare-Donkor, Noah Kyame
dc.date.accessioned2014-08-12T11:12:44Z
dc.date.accessioned2023-04-21T00:27:17Z
dc.date.available2014-08-12T11:12:44Z
dc.date.available2023-04-21T00:27:17Z
dc.date.issued2013-08-12
dc.descriptionA thesis submitted to the Department of Chemistry, College of Science Kwame Nkrumah University of Science and Technology, Kumasi, in partial fulfillment for the award of the Degree of Doctor of Philosophy (Inorganic Chemistry), 2013en_US
dc.description.abstractNanostructured thin films of CuE (E=S, Se, Te) have been prepared at the water-toluene interface by reacting toluene solutions of copper cupferronates with aqueous chalcogenide ions obtained by the borohydride reduction of sulphur, selenium and tellurium powder. The thin film deposits were characterized by powder X-ray crystallography, scanning electron microscopy and absorption spectroscopy. The influence of deposition conditions such as precursor concentrations, temperature as well as deposition times were studied. The average crystallite sizes of the as-prepared nanoparticles at different temperatures, concentrations and deposition times ranged from 3.4 to 4.3 nm for CuS, 5.1 to 5.7 nm for CuSe and 1.4 to 4.5 nm for CuTe. The dislocation densities ranged from 5.46 to 8.85 x 1017 lines/m for CuS and 2.32 to 3.86 x 1017 lines/m for CuSe, 5.0 to 47.91 x 1017 lines/m for CuTe. The shape of the as-prepared nanoparticles at different temperatures was studied by SEM and gave morphologies from cubes to rods. The band gaps obtained for CuS ranged from 3.6 to 3.9 eV and CuSe ranged from 3.53 to 3.96 eVen_US
dc.description.sponsorshipKNUSTen_US
dc.identifier.urihttps://ir.knust.edu.gh/handle/123456789/6310
dc.language.isoenen_US
dc.titleStructural and optoelectronic properties of copper, zinc, cadmium and lead chalcogenide nanocrystalline thin films deposited at the water-toluene interfaceen_US
dc.typeThesisen_US
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